Krupka, J.
, Geyer, R.
, Baker-Jarvis, J.
and Ceremuga, J.
(1996),
Measurements of the Complex Permittivity of Microwave Circuit Board Substrates Using Split Dielectric Resonator and Reentrant Cavity Techniques, Proc., IEEE Conf. Dielectric Materials, Meas. Appli., Bath, 1, EN
(Accessed April 23, 2024)
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Measurements of the Complex Permittivity of Microwave Circuit Board Substrates Using Split Dielectric Resonator and Reentrant Cavity Techniques
Published
Author(s)
Jerzy Krupka, , , J. G. Ceremuga
Proceedings Title
Proc., IEEE Conf. Dielectric Materials, Meas. Appli.
Conference Dates
September 23-26, 1996
Conference Location
Bath, 1, EN
Pub Type
Conferences
Citation
Created August 31, 1996, Updated October 12, 2021