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Measurements of the Complex Permittivity of Microwave Circuit Board Substrates Using Split Dielectric Resonator and Reentrant Cavity Techniques

Published

Author(s)

Jerzy Krupka, Richard G. Geyer, James R. Baker-Jarvis, J. G. Ceremuga
Proceedings Title
Proc., IEEE Conf. Dielectric Materials, Meas. Appli.
Conference Dates
September 23-26, 1996
Conference Location
Bath, 1, EN

Citation

Krupka, J. , Geyer, R. , Baker-Jarvis, J. and Ceremuga, J. (1996), Measurements of the Complex Permittivity of Microwave Circuit Board Substrates Using Split Dielectric Resonator and Reentrant Cavity Techniques, Proc., IEEE Conf. Dielectric Materials, Meas. Appli., Bath, 1, EN (Accessed April 14, 2024)
Created August 31, 1996, Updated October 12, 2021