TY  - CONF
AU  - Jerzy Krupka
AU  - Richard Geyer
AU  - James Baker-Jarvis
AU  - J. Ceremuga
C2  - Proc., IEEE Conf. Dielectric Materials, Meas. Appli., Bath, 1, EN
DA  - 1996-09-01 00:09:00
LA  - en
PB  - Proc., IEEE Conf. Dielectric Materials, Meas. Appli., Bath, 1, EN
PY  - 1996
TI  - Measurements of the Complex Permittivity of Microwave Circuit Board Substrates Using Split Dielectric Resonator and Reentrant Cavity Techniques
ER  -