Larrabee, R.
(1983),
Measurement techniques for high-resistivity detector-grade silicon ::progress report, July 1, 1982 to June 30, 1983, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.83-2792
(Accessed December 4, 2024)
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Measurement techniques for high-resistivity detector-grade silicon ::progress report, July 1, 1982 to June 30, 1983
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- NBS IR 83-2792
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NBS IR 83-2792
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NIST Pubs
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Created January 1, 1983, Updated May 19, 2023