TY - GEN AU - R D Larrabee C2 - , National Institute of Standards and Technology, Gaithersburg, MD DA - 1983-01-01 05:01:00 DO - https://doi.org/10.6028/NBS.IR.83-2792 LA - en PB - , National Institute of Standards and Technology, Gaithersburg, MD PY - 1983 TI - Measurement techniques for high-resistivity detector-grade silicon ::progress report, July 1, 1982 to June 30, 1983 ER -