Oettinger, F.
(1978),
Measurement techniques for high power semiconductor materials and devices ::Annual report, January 1, to December 31, 1977, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.78-1474
(Accessed March 25, 2025)
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Measurement techniques for high power semiconductor materials and devices ::Annual report, January 1, to December 31, 1977
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- NBS IR 78-1474
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NBS IR 78-1474
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NIST Pubs
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Created January 1, 1978, Updated May 19, 2023