@misc{1184416, author = {F F Oettinger}, title = {Measurement techniques for high power semiconductor materials and devices ::Annual report, January 1, to December 31, 1977}, year = {1978}, month = {1978-01-01 05:01:00}, publisher = {, National Institute of Standards and Technology, Gaithersburg, MD}, doi = {https://doi.org/10.6028/NBS.IR.78-1474}, language = {en}, }