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Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1980 to December 31, 1981

Published

Author(s)

W R Thurber, W E Phillips, R D Larrabee
Citation
- NBS IR 82-2552
Report Number
NBS IR 82-2552

Citation

Thurber, W. , Phillips, W. and Larrabee, R. (1982), Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1980 to December 31, 1981, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.82-2552 (Accessed June 16, 2024)

Issues

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Created January 1, 1982, Updated May 19, 2023