TY  - GEN
AU  - Thurber, W R
AU  - Phillips, W E
AU  - Larrabee, R D
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1982-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.82-2552
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1982
TI  - Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1980 to December 31, 1981
ER  -