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Measurement techniques for high-power semiconductor materials and devices ::annual report, January 1, 1982 to March 31, 1983

Published

Author(s)

W R Thurber, J R Lowney, W E Phillips
Citation
- NBS IR 84-2838
Report Number
NBS IR 84-2838

Citation

Thurber, W. , Lowney, J. and Phillips, W. (1984), Measurement techniques for high-power semiconductor materials and devices ::annual report, January 1, 1982 to March 31, 1983, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.84-2838 (Accessed May 19, 2024)

Issues

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Created January 1, 1984, Updated May 19, 2023