TY  - GEN
AU  - Thurber, W R
AU  - Lowney, J R
AU  - Phillips, W E
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1984-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.84-2838
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1984
TI  - Measurement techniques for high-power semiconductor materials and devices ::annual report, January 1, 1982 to March 31, 1983
ER  -