Innovations in ceramic technologies are often driven by the discovery and introduction of a material with novel or improved behavior that enables realization of a superior component, device or system. Over the past few decades, advanced ceramic materials have spurred growth across all technology sectors, for example, gate dielectrics for semiconductor electronics, high frequency dielectrics for microwave communication, and semiconducting light emitting diodes for traffic signals and lighted signs. Looking to the future, ceramic materials will play a vital enabling role in emerging applications such as semiconductor quantum dots for drug delivery, multiferroics for multifunctional sensing devices, and thermoelectrics for vehicular waste heat-recovery. Performance of the components, devices and systems incorporating these and other novel ceramic materials will depend on the behavior of the materials, which, in turn, is determined by the relationships between the structure and properties of the materials. More powerful and rapid standardized measurements of material structure and properties are needed to guide and accelerate materials and process selection and optimization for advanced applications. Nanotechnology is becoming increasingly pervasive, and many existing measurement methods are not capable of probing nanoscale dimensions and entities. Meeting these measurement needs will require the development of measurement science the underlying physical principles forming the basis for the measurement as well as measurement technology the instrumentation, methods, models, and standards enabling an accurate and precise measurement. This paper provides specific examples of how measurement science and technology can enable the development and incorporation of ceramic materials in a wide spectrum of applications.
Proceedings Title: International Congress on Ceramics | 1st | | ACS
Conference Dates: June 24-30, 2006
Conference Location: Toronto, -1
Conference Title: International Congress on Ceramics Proceedings
Pub Type: Conferences
ceramics, measurement methods, measurement science, metrology, models, nanotechnology, standards, structure properties