Larson, D.
(1981),
A Measurement Method for Determining the Optical and Electro-Optical Properties of a Thin Film, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed March 25, 2025)
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A Measurement Method for Determining the Optical and Electro-Optical Properties of a Thin Film
Published
Author(s)
Citation
NIST Interagency/Internal Report (NISTIR) - 81-1652
Report Number
81-1652
Issue
23
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 1, 1981, Updated January 27, 2020