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A Measurement Method for Determining the Optical and Electro-Optical Properties of a Thin Film

Published

Author(s)

Donald R. Larson
Citation
NIST Interagency/Internal Report (NISTIR) - 81-1652
Report Number
81-1652
Issue
23

Citation

Larson, D. (1981), A Measurement Method for Determining the Optical and Electro-Optical Properties of a Thin Film, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed June 14, 2024)

Issues

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Created December 1, 1981, Updated January 27, 2020