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Measurement of carrier lifetime in semiconductors::an annotated bibliography covering the period 1949-1967

Published

Author(s)

W Murray Bullis
Citation
- NBS TN 465
Report Number
NBS TN 465

Citation

Bullis, W. (1968), Measurement of carrier lifetime in semiconductors::an annotated bibliography covering the period 1949-1967, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.465 (Accessed May 27, 2024)

Issues

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Created January 1, 1968, Updated May 19, 2023