Bullis, W.
(1968),
Measurement of carrier lifetime in semiconductors::an annotated bibliography covering the period 1949-1967, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.465
(Accessed April 25, 2024)
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Measurement of carrier lifetime in semiconductors::an annotated bibliography covering the period 1949-1967
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Author(s)
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- NBS TN 465
Report Number
NBS TN 465
Pub Type
NIST Pubs
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Created January 1, 1968, Updated May 19, 2023