TY  - GEN
AU  - W Murray Bullis
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1968-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.465
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1968
TI  - Measurement of carrier lifetime in semiconductors::an annotated bibliography covering the period 1949-1967
ER  -