Kacker, R.
, Kuhn, D.
and Wong, E.
(2018),
MCDC-Star – An Open-source MC/DC Measurement Tool, Proceedings of 11-th European Software Engineering Conference and the ACM SIGSOFT Symposium on the Foundations of Software Engineering, Paderborn, -1, [online], https://doi.org/10.1109/DSA.2018.00027
(Accessed October 5, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
MCDC-Star An Open-source MC/DC Measurement Tool
Published
Author(s)
, , Eric Wong
Abstract
Applying MC/DC criterion to real-world projects can be expensive due to not only the cost of commercial tools, but also the difficulty of generating test cases to achieve high coverage. To lower the expense from both aspects, this paper presents an easy-to-use and openly accessible MC/DC measurement tool, MCDC-Star, that provides an accurate measurement on MC/DC coverage for software written in multiple programming languages and aids practitioners in generating test cases that can achieve high MC/DC overage in an effective way.Proceedings Title
Proceedings of 11-th European Software Engineering Conference and the ACM SIGSOFT Symposium on the Foundations of Software Engineering
Conference Dates
September 4-8, 2017
Conference Location
Paderborn
Conference Title
11-th European Software Engineering Conference and the ACM SIGSOFT Symposium on the Foundations of Software Engineering
Pub Type
Conferences
Download Paper
Keywords
MC/DC Measurement, Instrumentation, Code Coverage
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created September 21, 2018, Updated September 21, 2020