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PUBLICATIONS

MCDC-Star – An Open-source MC/DC Measurement Tool

Published

Author(s)

Raghu N. Kacker, David R. Kuhn, Eric Wong

Abstract

Applying MC/DC criterion to real-world projects can be expensive due to not only the cost of commercial tools, but also the difficulty of generating test cases to achieve high coverage. To lower the expense from both aspects, this paper presents an easy-to-use and openly accessible MC/DC measurement tool, MCDC-Star, that provides an accurate measurement on MC/DC coverage for software written in multiple programming languages and aids practitioners in generating test cases that can achieve high MC/DC overage in an effective way.
Proceedings Title
Proceedings of 11-th European Software Engineering Conference and the ACM SIGSOFT Symposium on the Foundations of Software Engineering
Conference Dates
September 4-8, 2017
Conference Location
Paderborn
Conference Title
11-th European Software Engineering Conference and the ACM SIGSOFT Symposium on the Foundations of Software Engineering
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/DSA.2018.00027
Local Download

Keywords

MC/DC Measurement, Instrumentation, Code Coverage
Software testing and Software research

Citation

Kacker, R. , Kuhn, D. and Wong, E. (2018), MCDC-Star – An Open-source MC/DC Measurement Tool, Proceedings of 11-th European Software Engineering Conference and the ACM SIGSOFT Symposium on the Foundations of Software Engineering, Paderborn, -1, [online], https://doi.org/10.1109/DSA.2018.00027 (Accessed May 4, 2024)

Created September 21, 2018, Updated September 21, 2020