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Mass Spectrometric and Optical Emission Diagnostics for RF Plasma Reactors

Published

Author(s)

James K. Olthoff, J R. Roberts, R J. Van brunt, James Whetstone, M A. Sobolewski, S Djurovi{cacute}
Proceedings Title
Technical Symposium on Microelectronic Processing Integration
Conference Dates
September 9-13, 1991
Conference Location
San Jose, CA, USA
Conference Title
SPIE Technical Symposium on Microelectronic Processing Integration

Citation

Olthoff, J. , Roberts, J. , Van brunt, R. , Whetstone, J. , Sobolewski, M. and Djurovi{cacute}, S. (1991), Mass Spectrometric and Optical Emission Diagnostics for RF Plasma Reactors, Technical Symposium on Microelectronic Processing Integration , San Jose, CA, USA (Accessed December 9, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 1990, Updated October 12, 2021