Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Lumped-Element Models for On-Wafer Calibration

Published

Author(s)

Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley

Abstract

We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards, but do not have more degrees of freedom than absolutely necessary.
Proceedings Title
Tech. Dig., Automatic Radio Frequency Techniques Group (ARFTG) Conference
Volume
38
Conference Dates
November 30-December 1, 2000
Conference Location
Boulder, CO

Keywords

netowrk analyzer, on-waver calibration, OSLT, SOLR, SOLT, TRL calibration

Citation

Walker, D. , Kaiser, R. , Williams, D. and Coakley, K. (2000), Lumped-Element Models for On-Wafer Calibration, Tech. Dig., Automatic Radio Frequency Techniques Group (ARFTG) Conference, Boulder, CO, [online], https://doi.org/10.1109/ARFTG.2000.327431 (Accessed March 29, 2024)
Created December 1, 2000, Updated January 27, 2020