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Low-Frequency RF Absorber Performance Evaluation Using In Situ and Moveable Sample Techniques

Published

Author(s)

Robert T. Johnk, Arthur Ondrejka, H. W. Medley

Abstract

The purpose of this paper is to describe two free space measurement systems, developed at NIST for the evaluation of RF aborbers, and to demonstrate capabilities using measurement examples. The first consists of a moveable measurement system that performs in situ measurements of the reflectivity of a selected section of absorber wall in a chamber. The second is a fixed measurement system, deployed in conjunction with a moveable sample of absorbing material to be tested. Normal incidence results are presented for the in situ measurement system, and both normal and oblique incidence scattering results are shown for the moveable sample system. Typical Type-A measurement uncertainties are also shown for both systems.
Proceedings Title
Proc. Electromagnetic Compatibility (EMC) Symposium
Volume
2
Conference Dates
August 24-28, 1998
Conference Location
Denver, CO

Keywords

absorber-lined chamber, deconvolution, hybrid, in situ, moveable sample, synthetic time-domain, TEM horn, time gating

Citation

Johnk, R. , Ondrejka, A. and Medley, H. (1998), Low-Frequency RF Absorber Performance Evaluation Using In Situ and Moveable Sample Techniques, Proc. Electromagnetic Compatibility (EMC) Symposium, Denver, CO (Accessed February 25, 2024)
Created July 31, 1998, Updated October 12, 2021