Young, M.
(1980),
Linearity and resolution of refracted near-field scanning technique, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=11400
(Accessed April 26, 2024)
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Linearity and resolution of refracted near-field scanning technique
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Author(s)
M. Young
Abstract
Refracted near-field scanning is an attractive method for precisely determining the index profile of an optical waveguide. This method was first proposed and demonstrated by Stewart and later refined by White. In an earlier paper, I analyzed the linearity and precision of the method; this paper additionally discusses resolution and related areas.Citation
NIST Interagency/Internal Report (NISTIR) -
NIST Pub Series
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NIST Pubs
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Created October 1, 1980, Updated February 17, 2017