Skip to main content
U.S. flag

An official website of the United States government

Lifetime Measurements in 178Hf

Published

Author(s)

R C. de Haan, A Aprahamian, H G. Borner, C Doll, M Jentschel, A M. Bruce, S R. Lesher
Citation
Journal of Research (NIST JRES) -
Volume
105 No. 1

Keywords

level lifetimes, phonon excitations, radioactive hafnium

Citation

de, R. , Aprahamian, A. , Borner, H. , Doll, C. , Jentschel, M. , Bruce, A. and Lesher, S. (2000), Lifetime Measurements in <sup>178</sup>Hf, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed December 15, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 1, 2000, Updated February 17, 2017