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Lifetime Measurements in 178Hf

Published

Author(s)

R C. de Haan, A Aprahamian, H G. Borner, C Doll, M Jentschel, A M. Bruce, S R. Lesher
Citation
Journal of Research (NIST JRES) -
Volume
105 No. 1

Keywords

level lifetimes, phonon excitations, radioactive hafnium

Citation

de, R. , Aprahamian, A. , Borner, H. , Doll, C. , Jentschel, M. , Bruce, A. and Lesher, S. (2000), Lifetime Measurements in <sup>178</sup>Hf, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed April 23, 2024)
Created April 1, 2000, Updated February 17, 2017