Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Learning About SANS Instruments and Data Reduction from Round Robin Measurements on Samples of Polystyrene Latex

Published

Author(s)

Adrian R. Rennie, Maja S. Hellsing, Kathleen Wood, Elliot P. Gilbert, Lionel Porcar, Ralf Schweins, Charles D. Dewhurst, Peter Lindner, Richard K. Heenan, Sarah E. Rogers, Paul Butler, Jeffery R Krzywon, Ron E. Ghosh, Andrew J. Jackson, Marc Malfois

Abstract

Round-robin measurements of polystyrene latex samples at a number of small-angle scattering facilities have been used to assess the current limits of reliability and reproducibility of scattering data as well as the accuracy of parameters derived from subsequent analysis such as the radius and polydispersity. These results are used to develop understanding and improve the technique.
Citation
Journal of Applied Crystallography
Volume
46

Keywords

Small-angle neutron scattering, Uncertainties, Reliability, Reproducibility, Polystyrene Latex

Citation

Rennie, A. , Hellsing, M. , Wood, K. , Gilbert, E. , Porcar, L. , Schweins, R. , Dewhurst, C. , Lindner, P. , Heenan, R. , Rogers, S. , Butler, P. , Krzywon, J. , Ghosh, R. , Jackson, A. and Malfois, M. (2013), Learning About SANS Instruments and Data Reduction from Round Robin Measurements on Samples of Polystyrene Latex, Journal of Applied Crystallography, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=913483 (Accessed October 3, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created September 30, 2013, Updated October 12, 2021
Was this page helpful?