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Investigations of Magnetic Microstructures Using Scanning Electron Microscopy with Spin Polarization Analysis

Published

Author(s)

John Unguris, G Hembree, Robert Celotta, Daniel T. Pierce

Abstract

A field emission scanning electron microscope was fitted with electron spin polarization analyzers in order to image submicron magnetic microstructures. Spin polarization analysis of the emitted secondary electrons provides a direct measurement of the magnitude and direction of the magnetization in the area probed by the incident electron beam. The polarization measurement is independent of topographic contrast which is measured simultaneously. The polarization was measured using a new type of analyzer which is very compact, simple, and at least as efficient as a Mott detector. The small detector size allowed the use of multiple orthogonal detectors so that all three components of the magnetization vector could be measured. This apparatus was used to examine the domain structure of various Fe-3% Si crystals.
Citation
Journal of Magnetism and Magnetic Materials
Volume
54-57

Citation

Unguris, J. , Hembree, G. , Celotta, R. and Pierce, D. (1986), Investigations of Magnetic Microstructures Using Scanning Electron Microscopy with Spin Polarization Analysis, Journal of Magnetism and Magnetic Materials (Accessed February 28, 2024)
Created January 1, 1986, Updated February 19, 2017