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Inverstigation of the Intrinsic SiO2 Area Dependence Using TDDB Testing

Published

Author(s)

J. Prendergast, John S. Suehle
Proceedings Title
1997 IEEE International Integrated Reliability Workshop Final Report
Conference Dates
October 13-16, 1997
Conference Location
Lake Tahoe, CA, USA

Citation

Prendergast, J. and Suehle, J. (1997), Inverstigation of the Intrinsic SiO<sub>2</sub> Area Dependence Using TDDB Testing, 1997 IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA (Accessed July 20, 2024)

Issues

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Created December 30, 1997, Updated October 12, 2021