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PUBLICATIONS

Internet of Things (IoT) Metrology

Published

Author(s)

Jeff Voas, D. Richard Kuhn, Phillip Laplante

Abstract

The field of metrology has evolved into many classes and viewpoints over centuries of time. What we are suggesting is how that body of knowledge may be applicable to IoT and where the research opportunities for new measures that are IoT-centric might be in plain view but appear to be hiding. That is, what might IoT metrology look like if we were to create this sub-field based on what we can leverage from the past?
Citation
IEEE IT Professional
Volume
20
Issue
3
Pub Type
Journals

Download Paper

https://doi.org/10.1109/MITP.2018.032501740
Local Download

Keywords

cyber physical systems, internet of things, metrics, metrology
Information technology

Citation

Voas, J. , Kuhn, D. and Laplante, P. (2018), Internet of Things (IoT) Metrology, IEEE IT Professional, [online], https://doi.org/10.1109/MITP.2018.032501740, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925808 (Accessed October 20, 2025)

Issues

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Created June 10, 2018, Updated October 12, 2021
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