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Instrumentation, Metrology, and Standards: Key Elements for the Future of Nanomanufacturing

Published

Author(s)

Michael T. Postek, Kevin W. Lyons

Abstract

Nanomanufacturing is the essential bridge between the discoveries of nanoscience and real world nanotech products and is the vehicle by which the Nation and the World will realize the promise of major technological innovation across a spectrum of products that will affect virtually every industrial sector. For nanotech products to achieve the broad impacts envisioned, they must be manufactured in market-appropriate quantities in a reliable, repeatable, economical and commercially viable manner. In addition, they must be manufactured so that environmental and human health concerns are met, worker safety issues are appropriately assessed and handled, and liability issues are addressed. Critical to this realization of robust nanomanufacturing is the development of the necessary instrumentation, metrology, and standards. Integration of the instruments, their interoperability, and appropriate information management are also critical elements that must be considered for viable nanomanufacturing. Advanced instrumentation, metrology and standards will allow the physical dimensions, properties, functionality, and purity of the materials, processes, tools, systems, products, and emissions that will constitute nanomanufacturing to be measured and characterized. This will in turn enable production to be scaleable, controllable, predictable, and repeatable to meet market needs. If a nano-product cannot be measured it cannot be manufactured; additionally if that product cannot be made safely it should not be manufactured. This presentation introduces the Instrumentation, Metrology, and Standards for Nanomanufacturing Conference at the 2007 SPIE Optics and Photonics. This conference will become the leading forum for the exchange of foundational information and discussion of instrumentation, metrology and standards which are key elements for the success of nanomanufacturing.
Proceedings Title
Proceedings of SPIE
Volume
6648
Conference Dates
August 29, 2007
Conference Location
San Diego, CA
Conference Title
Instrumentation, Metrology, and Standards for Nanomanufacturing, Michael T. Postek, John A. Allgair, Editors

Keywords

instrumentation, measurement, metrology, nanomanufacturing, nanometrology, standards

Citation

Postek, M. and Lyons, K. (2007), Instrumentation, Metrology, and Standards: Key Elements for the Future of Nanomanufacturing, Proceedings of SPIE, San Diego, CA (Accessed June 16, 2024)

Issues

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Created September 1, 2007, Updated February 19, 2017