Infrared hemispherical reflectance of carbon nanotube mats and arrays in the 5 µm to 50 µm wavelength region

Published

November 1, 2012

Author(s)

Chris Chunnilall, Aric Sanders, John H. Lehman, Evangelos Theocharous

Abstract

We present the absolute infrared (5 u}m to 50 u}m) hemispherical reflectance of films produced from commercially available carbon nanotubes. Data were obtained using the upgraded NPL directional- hemispherical reflectance measurement facility. A brief description of this facility is presented, along with imaging and the results of the measurement of the test samples. One group of samples consisted of mats of carbon nanotubes with potassium silicate binder sprayed on copper or silicon substrates. Another group consisted of vertically aligned carbon nanotubes grown on silicon. The emphasis of our study is the evaluation of materials suitable for radiometric applications such as black coatings for thermal detectors, baffles and broadband absorbers in the infrared. Two of the materials studied exhibited the lowest reflectances so far observed in the infrared wavelength region.

Citation

Carbon

Volume

50

Issue

14

Pub Type

Journals

Keywords

carbon nanotube, hemispherical reflectance, infrared, reflectance

Citation

Chunnilall, C. , Sanders, A. , Lehman, J. and Theocharous, E. (2012), Infrared hemispherical reflectance of carbon nanotube mats and arrays in the 5 µm to 50 µm wavelength region, Carbon (Accessed December 12, 2024)