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Influence of Avalanch-Photodiode Dead Time on the Security of High-speed Quantum-Key Distribution Systems
Published
Author(s)
Hai Xu, Lijun Ma, Joshua Bienfang, Xiao Tang
Abstract
We study the correlation in the sifted key induced by the dead time of Geirger-mode avalanche-photodiodes (APDs) in quantum key distribution systems. A simultaneous holdoff of the APDs (SHA) technique eliminates these correlations.
Conference Dates
May 21-26, 2006
Conference Location
Long Beach, CA, USA
Conference Title
Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science, CLEO/QUELS Conference
Xu, H.
, Ma, L.
, Bienfang, J.
and Tang, X.
(2006),
Influence of Avalanch-Photodiode Dead Time on the Security of High-speed Quantum-Key Distribution Systems, Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science, CLEO/QUELS Conference, Long Beach, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=150580
(Accessed October 9, 2025)