Kuhn, D.
and Kacker, R.
(2019),
Improving MC/DC and Fault Detection Strength Using Combinatorial Testing, Proceedings of IEEE International Conference on Quality, Reliability, and Security, Prague, CZ, [online], https://doi.org/10.1109/QRS-C.2017.131, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923729
(Accessed April 25, 2024)
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Improving MC/DC and Fault Detection Strength Using Combinatorial Testing
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Abstract
Software, in many different fields and tasks, has played a critical role and even replaced humans to improve efficiency and safety. However, catastrophic consequences can be caused by implementation bugs and design defects. MC/DC (Modified Condition Decision Coverage), required by the Federal Aviation Administration on Level A (the most safety critical system), has been shown to be effective in detecting software bugs. However, generating tests to achieve high MC/DC can be very expensive and time consuming. Recently, many studies showed that combinatorial testing (CT) could generate high-quality test cases in a cost-effective way. Can CT generate test cases for high MC/DC? In this paper, we conduct an empirical study on two real-life programs to evaluate the efficiency and effectiveness of using combinatorial testing to improve MC/DC coverage achievement, as well as the fault detection strength.Proceedings Title
Proceedings of IEEE International Conference on Quality, Reliability, and Security
Conference Dates
July 25-29, 2017
Conference Location
Prague, CZ
Conference Title
IEEE International Conference on Quality, Reliability, and Security
Pub Type
Conferences
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Keywords
Combinatorial Testing, MC/DC Coverage, Fault Detection
Citation
Created July 24, 2019, Updated October 12, 2021