TY - CONF AU - D. Kuhn AU - Raghu Kacker C2 - Proceedings of IEEE International Conference on Quality, Reliability, and Security, Prague, CZ DA - 2019-07-25 00:07:00 DO - https://doi.org/10.1109/QRS-C.2017.131 LA - en PB - Proceedings of IEEE International Conference on Quality, Reliability, and Security, Prague, CZ PY - 2019 TI - Improving MC/DC and Fault Detection Strength Using Combinatorial Testing UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923729 ER -