@conference{792601,
  author = {D. Kuhn and Raghu Kacker},
  title = {Improving MC/DC and Fault Detection Strength Using Combinatorial Testing},
  year = {2019},
  month = {2019-07-25 00:07:00},
  publisher = {Proceedings of IEEE International Conference on Quality, Reliability, and Security, Prague, CZ},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923729},
  doi = {https://doi.org/10.1109/QRS-C.2017.131},
  language = {en},
}