Soft X-ray beam-line applications are of fundamental importance to material research, and commonly employ high-resolution Si(Li) detectors for Energy Dispersive Spectroscopy. However, the measurement of X-rays below 1 keV compromised by absorption in the material layers in front of the active crystal and a dead-layer at the crystal surface. Various Schottky barrier type contacts were investigated resulting in a 40% reduction of the dead-layer thickness and a factor of two increased sensitivity at carbon K compared to the standard Si(Li) detector. Si(Li) detectors were tested on the U7A soft X-ray beam-line at the National Synchrotron Light Source and on a Scanning Electron Microscope (SEM).
Citation: Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms
Pub Type: Journals
14-channel multi-element array detector, collection efficiency below 1keV, dead layer, Si(Li) detector