Wang, Y.
and Shields, S.
(2005),
Improved Capacitance Measurements with Respect to a 1 pF Cross Capacitor from 200 Hz to 2000 Hz, IEEE Transactions on Instrumentation and Measurement
(Accessed May 2, 2025)
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Improved Capacitance Measurements with Respect to a 1 pF Cross Capacitor from 200 Hz to 2000 Hz
Published
Author(s)
,
Abstract
We describe frequency dependence measurements of fused-silica capacitance standards from 200 Hz to 2000 Hz, using a 1 pF cross capacitor as the reference. Frequency dependence of fused-silica capacitors varies significantly, ranging from a change of less than 0.2x10-6 for one standard to a net change of 0.8x10-6 for another over the frequency range. Overall increasing capacitances with decreasing frequency from 1592Hz for all tested fused-silica capacitors indicates that dielectric relaxation due to dielectric bulk and/or interfacial defects is the dominant source of frequency dependence. The relative combined standard uncertainty at 200 Hz (the largest in the frequency range) is 0.07'10-6, which is smaller by about a factor of three than the uncertainty reported earlier from NIST.Citation
IEEE Transactions on Instrumentation and Measurement
Pub Type
Journals
Keywords
Capacitance, cross capacitor, farad, frequency dependence., fused-silica capacitor
Citation
Issues
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Created March 31, 2005, Updated October 12, 2021