The Impact of Long-term Memory Effects on Diode Power Probes
Catherine A. Remley, Hugo Gomes, Alejandro Testera, Nuno B. Carvalho, Monica Barciela
This paper presents an analysis of long term memory effects on power measurements using diode power probes. It will be shown that a power probe calibrated with a single-tone sinusoidal excitation can provide erroneous values when used with modulated signals. This fact is ascribed to the low-frequency response imposed by the power probe baseband circuit. This hypothesis is first theoretically demonstrated by use of Volterra Series, and then validated by simulations and measurements using a diode power probe.
2010 IEEE MTT-S International Microwave Symposium Digest
, Gomes, H.
, Testera, A.
, Carvalho, N.
and Barciela, M.
The Impact of Long-term Memory Effects on Diode Power Probes, 2010 IEEE MTT-S International Microwave Symposium Digest, Anaheim, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904611
(Accessed December 2, 2023)