@conference{24781,
  author = {Catherine Remley and Hugo Gomes and Alejandro Testera and Nuno Carvalho and Monica Barciela},
  title = {The Impact of Long-term Memory Effects on Diode Power Probes},
  year = {2010},
  month = {2010-05-15},
  publisher = {2010 IEEE MTT-S International Microwave Symposium Digest, Anaheim, CA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904611},
  language = {en},
}