High-Temperature X-Ray Diffraction Study of Phase Evolution in Ba2YCu3O6+x Films Using the BaF2 Conversion Process

Published

August 1, 2003

Author(s)

Winnie K. Wong-Ng, Igor Levin, Mark D. Vaudin, Ron Feenstra, Lawrence P. Cook, James P. Cline

Abstract

In-situ high-temperature x-ray diffraction (HTXRD) was used to study the phase formation and reaction kinetics of the Ba₂Ycu₃O_6+x (Y-213) phase using the ex-situ BaF₂ conversion process. Three sets of films on single crystal SrTiO₃ substrates were prepared using e-beam co-evaporation technique of BaF₂, Y and Cu targets. HTXRD studies were conducted on precursor films with thickness of 0.3 m and 1.0 m. The 0.3 m films showed mainly (00l) texture whereas the 1.0 m films showed a significant volume fraction of (h00) texture as well. A semi-quantitative estimate of the texture fraction was accomplished using the software TexturePlus. The growth of Y-213 and the consumption of BaF₂ were found to beapproximately linear in time.

Citation

Advances In X-Ray Analysis

Pub Type

Journals

Keywords

Ba₂YCu₃O _6+x films, BaF₂ process, coated conductors, high-temperature x-ray diffraction, phase formation, texture

Citation

Wong-Ng, W. , Levin, I. , Vaudin, M. , Feenstra, R. , Cook, L. and Cline, J. (2003), High-Temperature X-Ray Diffraction Study of Phase Evolution in Ba₂YCu₃O_6+x Films Using the BaF₂ Conversion Process, Advances In X-Ray Analysis (Accessed April 18, 2024)