We investigate local electronic properties of CdTe solar cells using electron beam to excite electron-hole pairs and evaluate spatially resolved photocurrent characteristics. Standard semiconductor processes were used to fabricate Ohmic metal contacts on the surface of p-type CdTe / n-type CdS device extracted from a commercial solar panel. An ion milling process was used to prepare cross-sections of the devices. Local injection of carriers was controlled by an acceleration voltage of electron beam (1 kV 30 kV) in a scanning electron microscope (SEM), and the results were correlated with the local morphology and microstructure.
Conference Dates: June 4-8, 2012
Conference Location: Austin, TX
Conference Title: 38th IEEE Photovoltaic Specialists Conference
Pub Type: Conferences
solar cells, thin film, CdTe, grain boundary, electron beam induced current, EBIC, cross section, focused ion beam