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High Current Sic JBS Diode Characterization for Hard- and Soft-switching Applications

Published

Author(s)

Jih-Sheng Lai, X Huang, H. Yu, Allen R. Hefner Jr., David W. Berning, Ranbir Singh
Proceedings Title
Proc., IEEE Industry Applications Society (IAS) Annual Meeting
Conference Dates
September 30-October 4, 2001
Conference Location
Chicago, IL, USA
Conference Title
IEEE Industrial Applications Society Meeting

Citation

Lai, J. , Huang, X. , Yu, H. , Hefner Jr., A. , Berning, D. and Singh, R. (2001), High Current Sic JBS Diode Characterization for Hard- and Soft-switching Applications, Proc., IEEE Industry Applications Society (IAS) Annual Meeting, Chicago, IL, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30825 (Accessed June 17, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 30, 2001, Updated October 12, 2021