Lai, J.
, Huang, X.
, Yu, H.
, Hefner Jr., A.
, Berning, D.
and Singh, R.
(2001),
High Current Sic JBS Diode Characterization for Hard- and Soft-switching Applications, Proc., IEEE Industry Applications Society (IAS) Annual Meeting, Chicago, IL, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30825
(Accessed March 21, 2025)
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High Current Sic JBS Diode Characterization for Hard- and Soft-switching Applications
Published
Author(s)
Jih-Sheng Lai, X Huang, H. Yu, , , Ranbir Singh
Proceedings Title
Proc., IEEE Industry Applications Society (IAS) Annual Meeting
Conference Dates
September 30-October 4, 2001
Conference Location
Chicago, IL, USA
Conference Title
IEEE Industrial Applications Society Meeting
Pub Type
Conferences
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Citation
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created September 30, 2001, Updated October 12, 2021