Lee, N.
, Hartschuh, R.
, Mehtani, D.
, Kisliuk, A.
, Foster, M.
, Sokolov, A.
, Maguire, J.
and Green, M.
(2007),
High Contrast Scanning Nano-Raman Spectroscopy of Silicon, Journal of Raman Spectroscopy, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854366
(Accessed December 11, 2024)
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High Contrast Scanning Nano-Raman Spectroscopy of Silicon
Published
Author(s)
N Lee, R Hartschuh, D Mehtani, A Kisliuk, M D. Foster, Alexei Sokolov, J F. Maguire,
Citation
Journal of Raman Spectroscopy
Volume
38
Issue
6
Pub Type
Journals
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Citation
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 2007, Updated October 12, 2021