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HgCdTe Detector Reliability Study for the GOES Program

Published

Author(s)

David G. Seiler, George G. Harman, J R. Lowney, Santos D. Mayo, W S. Liggett
Citation
NIST Interagency/Internal Report (NISTIR) -

Citation

Seiler, D. , Harman, G. , Lowney, J. , Mayo, S. and Liggett, W. (1991), HgCdTe Detector Reliability Study for the GOES Program, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=11016 (Accessed May 18, 2024)

Issues

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Created September 29, 1991, Updated October 12, 2021