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Half-life Measurements of Sr82



Leticia S. Pibida, Ryan P. Fitzgerald, Michael P. Unterweger, Michelle M. Hammond, Daniel B. Golas


Half-life measurements of 82Sr were performed at the National Institute of Standards and Technology (NIST) using gamma-ray spectrometry and a 4 pressurized ionization chamber. The 82Sr half-life was determined to be 25.36 ± 0.03 days (k=1) using the gamma-ray spectrometry system and 25.34 ± 0.02 days (k=1) using the 4 pi-gamma pressurized ionization chamber.
Applied Radiation and Isotopes


gamma-ray spectrometry, ionization chamber, Sr82


Pibida, L. , Fitzgerald, R. , Unterweger, M. , Hammond, M. and Golas, D. (2009), Half-life Measurements of Sr82, Applied Radiation and Isotopes, [online], (Accessed April 16, 2024)
Created January 30, 2009, Updated February 19, 2017