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PUBLICATIONS

Four-dimensional scanning transmission electron microscopy: Part III, Ptychography

Published

Author(s)

Aaron Johnston-Peck, Andrew Herzing
Citation
Electronic Device Failure Analysis
Volume
26
Issue
4
Pub Type
Journals

Download Paper

https://doi.org/10.31399/asm.edfa.2024-4.p004
Local Download
Materials characterization

Citation

Johnston-Peck, A. and Herzing, A. (2024), Four-dimensional scanning transmission electron microscopy: Part III, Ptychography, Electronic Device Failure Analysis, [online], https://doi.org/10.31399/asm.edfa.2024-4.p004, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957072 (Accessed September 3, 2025)

Issues

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Created November 1, 2024, Updated August 18, 2025
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