TY  - JOUR
AU  - Johnston-Peck, Aaron
AU  - Herzing, Andrew
C2  - Electronic Device Failure Analysis
DA  - 2024-11-01 04:11:00
DO  - https://doi.org/10.31399/asm.edfa.2024-4.p004
LA  - en
M1  - 26
PB  - Electronic Device Failure Analysis
PY  - 2024
TI  - Four-dimensional scanning transmission electron microscopy: Part III, Ptychography
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957072
ER  -