Johnston-Peck, A.
and Herzing, A.
(2024),
Four-dimensional scanning transmission electron microscopy: Part II, Crystallographic orientation, short and medium range order, and electromagnetic fields, Electronic Device Failure Analysis Magazine, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956265
(Accessed April 27, 2024)
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Four-dimensional scanning transmission electron microscopy: Part II, Crystallographic orientation, short and medium range order, and electromagnetic fields
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Electronic Device Failure Analysis Magazine
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Created February 1, 2024, Updated February 23, 2024