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Four-dimensional scanning transmission electron microscopy: Part II, Crystallographic orientation, short and medium range order, and electromagnetic fields

Published

Author(s)

Aaron Johnston-Peck, Andrew Herzing
Citation
Electronic Device Failure Analysis Magazine

Citation

Johnston-Peck, A. and Herzing, A. (2024), Four-dimensional scanning transmission electron microscopy: Part II, Crystallographic orientation, short and medium range order, and electromagnetic fields, Electronic Device Failure Analysis Magazine, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956265 (Accessed April 17, 2024)
Created February 1, 2024, Updated February 23, 2024