TY  - VIDEO
AU  - Aaron Johnston-Peck
AU  - Andrew Herzing
C2  - Electronic Device Failure Analysis Magazine
DA  - 2024-02-01 05:02:00
LA  - en
PB  - Electronic Device Failure Analysis Magazine
PY  - 2024
TI  - Four-dimensional scanning transmission electron microscopy: Part II, Crystallographic orientation, short and medium range order, and electromagnetic fields
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956265
ER  -