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Finding and minimizing systematics in dual comb interferometry

Published

Author(s)

Mathieu Walsh, Philippe Guay, J.D. Deschenes, Nathan Malarich, Ian Coddington, Kevin Cossel, Jerome Genest

Abstract

With suficiently high signal-to-noise, several systematic errors become prominent in dual-comb interferometry measurements. This paper reviews several error sources including electrical, photo-detection, amplification and acquisition chain nonlinearity. Sources of optical non-linearity such as self-phase modulation, cross phase modulation and Raman soliton shifting are also covered, as are spectral fringing due to parasitic reflections and back-scattering. The non-linear response of the target sample itself can also be a source of errors. Methods to identify and minimize errors in experimental data are discussed. Good practices, instrument design strategies and tools, such as the dynamic range diagram, are suggested.
Citation
Journal of Physics B-Atomic Molecular and Optical Physics
Volume
58

Citation

Walsh, M. , Guay, P. , Deschenes, J. , Malarich, N. , Coddington, I. , Cossel, K. and Genest, J. (2025), Finding and minimizing systematics in dual comb interferometry, Journal of Physics B-Atomic Molecular and Optical Physics, [online], https://doi.org/10.1088/1361-6455/adac94, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=958506 (Accessed February 23, 2026)

Issues

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Created February 4, 2025, Updated February 18, 2026
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