Stevens, M.
, Hadfield, R.
, Schwall, R.
, Gupta, J.
, Nam, S.
and Mirin, R.
(2006),
Fast lifetime measurements of infrared emitters with low-jitter superconducting single photon detectors, Tech. Dig., Conf. on Lasers and Electro-Optics (CLEO), Long Beach, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32166
(Accessed December 6, 2024)
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Fast lifetime measurements of infrared emitters with low-jitter superconducting single photon detectors
Published
Author(s)
, , , James A. Gupta, ,
Abstract
We use a superconducting single photon detector with 65 ps jitter and <40 Hz dark count rate to measure spontaneous emission lifetimes of quantum wells emitting light in the 900-1300 nm wavelength range.Proceedings Title
Tech. Dig., Conf. on Lasers and Electro-Optics (CLEO)
Conference Dates
May 21-26, 2006
Conference Location
Long Beach, CA, USA
Conference Title
Conference on Lasers and Electro-Optics, Optical Society of America
Pub Type
Conferences
Download Paper
Keywords
photodetectors, picosecond phenomena, semiconductors, including MQW
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 25, 2006, Updated October 12, 2021