An improved x-ray microscope with a fully electronic CCD detector system has been constructed that allows improved laboratory-based microstructural investigations of materials with hard x-rays. It uses the Kirkpatrick-Baez multilayer mirror design to form an image that has a demonstrated resolution of 4 m at 8 keV (Cu Kα radiation). This microscope performs well with standard sealed-tube laboratory x-ray sources, producing digital images with 20-s exposure times for m Au grid (a thickness of two absorption lengths).
Citation: Applied Optics
Issue: No. 19
Pub Type: Journals
Kirkpatrick-Baez, microscope, multilayer, optics, x-ray