Shen, C.
, Hefner Jr., A.
, Berning, D.
and Bernstein, J.
(1998),
Failure Dynamics of the IGBT During Turn-Off for Unclamped Inductive Loading Conditions, Proc., IEEE Industry Applications Society (IAS) Annual Meeting, St. Louis, MO, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=3393
(Accessed October 17, 2025)
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Failure Dynamics of the IGBT During Turn-Off for Unclamped Inductive Loading Conditions
Published
Author(s)
Chien-Chung Shen, , , J B. Bernstein
Abstract
The internal failure dynamics of the Insulated Gate Bipolar Transistor (IBGT) for unclamped inductive switching (UIS) conditions are studied using simulations and measurements. The UIS measurements are made using a unique, automated nondestructive ReversProceedings Title
Proc., IEEE Industry Applications Society (IAS) Annual Meeting
Conference Dates
October 12-16, 1998
Conference Location
St. Louis, MO, USA
Conference Title
IEEE Industry Applications Society (IAS) Annual Meeting
Pub Type
Conferences
Download Paper
Keywords
automatic tester, avalanche, failure, IGBT, model, RBSOA
Citation
Issues
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Created December 30, 1998, Updated October 12, 2021