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Face Analysis Technology Evaluation (FATE) Part 11: Face Image Quality Vector Assessment: Specific Image Defect Detection

Published

Author(s)

Joyce Yang, Patrick J. Grother, Mei Lee Ngan, Kayee Hanaoka, Austin Hom
Citation
NIST Interagency/Internal Report (NISTIR) - 8485
Report Number
8485

Citation

Yang, J. , Grother, P. , Ngan, M. , Hanaoka, K. and Hom, A. (2023), Face Analysis Technology Evaluation (FATE) Part 11: Face Image Quality Vector Assessment: Specific Image Defect Detection, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.8485, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956188 (Accessed November 5, 2024)

Issues

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Created September 19, 2023