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Extended Abstract: Interfacial Scattering of Hot Electrons in Ultra-Thin Magnetic Films

Published

Author(s)

R P. Lu, B A. Morgan, K L. Kavanagh, Cedric J. Powell, P J. Chen, F Serpa, William F. Egelhoff Jr.

Abstract

In the emerging field of Spintronics the transport of hot electrons through magnetic thin films seems destined to play a key role. To help understand such transport, we have used ballistic electron emission microscopy (BEEM) to measure hot-electron transport across magnetic-metal multilayer/semiconductor structures.
Citation
Conference on the Physics and Chemistry of Semiconductor Interfaces

Keywords

ballistic electron emission microscopy (, hot electrons, spintronics, ultra-thin magnetic films

Citation

Lu, R. , Morgan, B. , Kavanagh, K. , Powell, C. , Chen, P. , Serpa, F. and Egelhoff Jr., W. (2021), Extended Abstract: Interfacial Scattering of Hot Electrons in Ultra-Thin Magnetic Films, Conference on the Physics and Chemistry of Semiconductor Interfaces (Accessed June 17, 2024)

Issues

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Created October 12, 2021